Influence of substrate on high-temperature behavior of copper film studied in situ by electron backscatter diffraction
Kabirkumar J. Mirpuri, Jerzy A. SzpunarVolume:
34
Year:
2005
Language:
english
Pages:
12
DOI:
10.1007/s11664-005-0158-6
File:
PDF, 1.85 MB
english, 2005