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The Correlation of Surface Defects and Reverse Breakdown of 4H-SiC Schottky Barrier Diodes
Kung-Yen Lee, Michael A. CapanoVolume:
36
Language:
english
Pages:
5
DOI:
10.1007/s11664-006-0075-3
Date:
April, 2007
File:
PDF, 338 KB
english, 2007