[IEEE 2020 IEEE Latin American Test Symposium (LATS) - Maceio, Brazil (2020.3.30-2020.4.2)] 2020 IEEE Latin-American Test Symposium (LATS) - Parametric faults detection and concealment on imager with FPGA implementation
Tchendjou, Ghislain Takam, Simeu, EmmanuelYear:
2020
DOI:
10.1109/LATS49555.2020.9093671
File:
PDF, 492 KB
2020