In-Situ Observation of Electromigration in Eutectic SnPb Solder Lines: Atomic Migration and Hillock Formation
Min-Seung Yoon, Min-Ku Ko, Oh-Han Kim, Young-Bae Park, William D. Nix, Young-Chang JooVolume:
36
Language:
english
Pages:
6
DOI:
10.1007/s11664-007-0102-z
Date:
May, 2007
File:
PDF, 341 KB
english, 2007