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Improved Defect and Fourier Transform Infrared Spectroscopy Analysis for Prediction of Yield for HgCdTe Multilayer Heterostructures
D.D. Lofgreen, M.F. Vilela, E.P. Smith, M.D. Newton, D. Beard, S.M. JohnsonVolume:
36
Language:
english
Pages:
5
DOI:
10.1007/s11664-007-0146-0
Date:
August, 2007
File:
PDF, 369 KB
english, 2007