The Influence of 0–0.1 wt.% Ni on the Microstructure and...

Journal of Electronic Materials 2008 / 01 Vol. 37; Iss. 1

The Influence of 0–0.1 wt.% Ni on the Microstructure and Fluidity Length of Sn-0.7Cu-xNi

Tina Ventura, Christopher M. Gourlay, Kazuhiro Nogita, Tetsuro Nishimura, Michel Rappaz, Arne K. Dahle
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Volume:
37
Language:
english
Pages:
8
DOI:
10.1007/s11664-007-0281-7
Date:
January, 2008
File:
PDF, 830 KB
english, 2008
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