[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Learning to Automate the Design Updates From Observed Engineering Changes in the Chip Development Cycle
Kravets, Victor N., Jiang, Jie-Hong R., Riener, HeinzYear:
2020
DOI:
10.23919/DATE48585.2020.9116310
File:
PDF, 577 KB
2020