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[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Emerging Neural Workloads and Their Impact on Hardware
Brooks, David, Frank, Martin M., Gokmen, Tayfun, Gupta, Udit, Hu, X. Sharon, Jain, Shubham, Laguna, Ann Franchesca, Niemier, Michael, O'Connor, Ian, Raghunathan, Anand, Ranjan, Ashish, Reis, Dayane, SYear:
2020
DOI:
10.23919/DATE48585.2020.9116435
File:
PDF, 1.41 MB
2020