Microstructure, Defects, and Reliability of Mixed...

Journal of Electronic Materials 2009 / 02 Vol. 38; Iss. 2

Microstructure, Defects, and Reliability of Mixed Pb-Free/Sn-Pb Assemblies

Polina Snugovsky, Heather McCormick, Simin Bagheri, Zohreh Bagheri, Craig Hamilton, Marianne Romansky
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Volume:
38
Language:
english
Pages:
11
DOI:
10.1007/s11664-008-0592-3
Date:
February, 2009
File:
PDF, 807 KB
english, 2009
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