Rutherford Backscattering Spectrometry Analysis of...

Rutherford Backscattering Spectrometry Analysis of Self-Formed Ti-Rich Interface Layer Growth in Cu(Ti)/Low-kSamples

Kazuyuki Kohama, Kazuhiro Ito, Kenichi Mori, Kazuyoshi Maekawa, Yasuharu Shirai, Masanori Murakami
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
38
Language:
english
Pages:
8
DOI:
10.1007/s11664-009-0843-y
Date:
September, 2009
File:
PDF, 638 KB
english, 2009
Conversion to is in progress
Conversion to is failed