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Imaging of Metal Impurities in Silicon by Luminescence...

Imaging of Metal Impurities in Silicon by Luminescence Spectroscopy and Synchrotron Techniques

Martin C. Schubert, Jonas Schön, Paul Gundel, Holger Habenicht, Wolfram Kwapil, Wilhelm Warta
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Volume:
39
Language:
english
Pages:
7
DOI:
10.1007/s11664-010-1114-7
Date:
June, 2010
File:
PDF, 830 KB
english, 2010
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