Imaging of Metal Impurities in Silicon by Luminescence Spectroscopy and Synchrotron Techniques
Martin C. Schubert, Jonas Schön, Paul Gundel, Holger Habenicht, Wolfram Kwapil, Wilhelm WartaVolume:
39
Language:
english
Pages:
7
DOI:
10.1007/s11664-010-1114-7
Date:
June, 2010
File:
PDF, 830 KB
english, 2010