Structural Characterization of Doped GaSb Single Crystals...

Journal of Electronic Materials 2010 / 06 Vol. 39; Iss. 6

Structural Characterization of Doped GaSb Single Crystals by X-ray Topography

M. G. Hönnicke, I. Mazzaro, J. Manica, E. Benine, E. M. da Costa, B. A. Dedavid, C. Cusatis, X. R. Huang
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Volume:
39
Language:
english
Pages:
5
DOI:
10.1007/s11664-010-1154-z
Date:
June, 2010
File:
PDF, 436 KB
english, 2010
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