Shockley–Haynes Characterization of Minority-Carrier Drift...

Shockley–Haynes Characterization of Minority-Carrier Drift Velocity, Diffusion Coefficient, and Lifetime in HgCdTe Avalanche Photodiodes

Johan Rothman, G. Vojetta, B. Moselle, L. Mollard, S. Gout, J.-P. Chamonal
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Volume:
39
Language:
english
Pages:
9
DOI:
10.1007/s11664-010-1247-8
Date:
July, 2010
File:
PDF, 566 KB
english, 2010
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