An optimized long short-term memory network based fault...

Journal of Process Control 2020 / 08 Vol. 92

An optimized long short-term memory network based fault diagnosis model for chemical processes

Han, Yongming, Ding, Ning, Geng, Zhiqiang, Wang, Zun, Chu, Chong
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Volume:
92
Journal:
Journal of Process Control
DOI:
10.1016/j.jprocont.2020.06.005
Date:
August, 2020
File:
PDF, 1.82 MB
2020
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