Dislocation Analysis in (112)B HgCdTe/CdTe/Si

Journal of Electronic Materials 2011 / 08 Vol. 40; Iss. 8

Dislocation Analysis in (112)B HgCdTe/CdTe/Si

J. D. Benson, S. Farrell, G. Brill, Y. Chen, P. S. Wijewarnasuriya, L. O. Bubulac, P. J. Smith, R. N. Jacobs, J. K. Markunas, M. Jaime-Vasquez, L. A. Almeida, A. Stoltz, U. Lee, M. F. Vilela, J. Peter
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Volume:
40
Language:
english
Pages:
7
DOI:
10.1007/s11664-011-1670-5
Date:
August, 2011
File:
PDF, 492 KB
english, 2011
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