Formation of GaAsP interface layers monitored by reflectance anisotropy spectroscopy
P. Kurpas, A. Oster, M. Weyers, A. Rumberg, K. Knorr, W. RichterVolume:
26
Year:
1997
Language:
english
Pages:
5
DOI:
10.1007/s11664-997-0013-z
File:
PDF, 169 KB
english, 1997