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Subnanometer Analysis and Modeling of MBE Grown InP Based MODFETs
Matthew Seaford, Scott Massie, Dave Hartzell, Glenn Martin, Warren Wu, John Tucker, Lester EastmanVolume:
26
Year:
1997
Language:
english
Pages:
4
DOI:
10.1007/s11664-997-0129-1
File:
PDF, 780 KB
english, 1997