Subnanometer Analysis and Modeling of MBE Grown InP Based...

Subnanometer Analysis and Modeling of MBE Grown InP Based MODFETs

Matthew Seaford, Scott Massie, Dave Hartzell, Glenn Martin, Warren Wu, John Tucker, Lester Eastman
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Volume:
26
Year:
1997
Language:
english
Pages:
4
DOI:
10.1007/s11664-997-0129-1
File:
PDF, 780 KB
english, 1997
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