Monitoring of CdTe atomic layer epitaxy...

Monitoring of CdTe atomic layer epitaxy usingin-situspectroscopic ellipsometry

S. Dakshinamurthy, I. Bhat
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Volume:
27
Year:
1998
Language:
english
Pages:
6
DOI:
10.1007/s11664-998-0008-4
File:
PDF, 218 KB
english, 1998
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