Measurement of minority carrier lifetime in n-type MBE...

Measurement of minority carrier lifetime in n-type MBE HgCdTe and its dependence on annealing

D. D. Edwall, R. E. DeWames, W. V. McLevige, J. G. Pasko, J. M. Arias
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Volume:
27
Year:
1998
Language:
english
Pages:
5
DOI:
10.1007/s11664-998-0039-x
File:
PDF, 196 KB
english, 1998
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