Measurement of minority carrier lifetime in n-type MBE HgCdTe and its dependence on annealing
D. D. Edwall, R. E. DeWames, W. V. McLevige, J. G. Pasko, J. M. AriasVolume:
27
Year:
1998
Language:
english
Pages:
5
DOI:
10.1007/s11664-998-0039-x
File:
PDF, 196 KB
english, 1998