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A novel test circuit for automatically detecting electrochemical migration and conductive anodic filament formation
W. Jud Ready, Laura J. Turbini, Roger Nickel, John FischerVolume:
28
Year:
1999
Language:
english
Pages:
6
DOI:
10.1007/s11664-999-0151-6
File:
PDF, 326 KB
english, 1999