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Cathodoluminescence spectroscopy of deep defect levels at the ZnSe/GaAs interface with a composition-control interface layer
J. Schäfer, A. P. Young, T. M. Levin, L. J. Brillson, J. J. Paggel, L. Vanzetti, A. FranciosiVolume:
28
Year:
1999
Language:
english
Pages:
6
DOI:
10.1007/s11664-999-0214-8
File:
PDF, 169 KB
english, 1999