Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2020 / 05 Vol. 38; Iss. 3
Dependence of growth temperature on the electrical properties and microstructure of MBE-grown AlN/GaN resonant tunneling diodes on sapphire
Storm, David F., Growden, Tyler A., Cornuelle, Evan M., Peri, Prudhvi R., Osadchy, Thomas, Daulton, Jeffrey W., Zhang, Wei-Dong, Katzer, D. Scott, Hardy, Matthew T., Nepal, Neeraj, Molnar, Richard, BrVolume:
38
Journal:
Journal of Vacuum Science & Technology B
DOI:
10.1116/6.0000052
Date:
May, 2020
File:
PDF, 2.94 MB
2020