[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Threshold Voltage Instability of Commercial 1.2 kV SiC Power MOSFETs
Yu, Susanna, Liu, Tianshi, Zhu, Shengnan, Xing, Diang, Salemi, Arash, Kang, Minseok, Booth, Kristen, White, Marvin H., Agarwal, Anant K.Year:
2020
DOI:
10.1109/IRPS45951.2020.9129071
File:
PDF, 657 KB
2020