[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Impact of Radiation on Negative Capacitance FinFET
Bajpai, Govind, Gupta, Aniket, Prakash, Om, Pahwa, Girish, Henkel, Jorg, Chauhan, Yogesh S., Amrouch, HussamYear:
2020
DOI:
10.1109/IRPS45951.2020.9129165
File:
PDF, 1.24 MB
2020