[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs
Van Beek, Simon, O'Sullivan, Barry J., Couet, Sebastien, Crotti, Davide, Linten, Dimitri, Kar, Gouri S.Year:
2020
DOI:
10.1109/IRPS45951.2020.9129551
File:
PDF, 737 KB
2020