Nanoscratch Characterization of GaN Epilayers on c- and...

Nanoscale Research Letters 2010 / 11 Vol. 5; Iss. 11

Nanoscratch Characterization of GaN Epilayers on c- and a-Axis Sapphire Substrates

Meng-Hung Lin, Hua-Chiang Wen, Yeau-Ren Jeng, Chang-Pin Chou
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Volume:
5
Language:
english
Pages:
5
DOI:
10.1007/s11671-010-9717-8
Date:
November, 2010
File:
PDF, 301 KB
english, 2010
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