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Characterization of Large-Area Silicon Drift Detectors at High Count Rates
Patt, B.E., Iwanczyk, J.S., Tull, C.R.Volume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927600036138
Date:
August, 2000
File:
PDF, 1.50 MB
2000