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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress
Kemmer, Tobias, Dammann, Michael, Baeumler, Martina, Polyakov, Vladimir, Bruckner, Peter, Konstanzer, Helmer, Quay, Rudiger, Ambacher, OliverYear:
2020
DOI:
10.1109/IRPS45951.2020.9128308
File:
PDF, 3.93 MB
2020