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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells
Ali, T., Kuhnel, K., Czernohorsky, M., Rudolph, M., Patzold, B., Olivo, R., Lehninger, D., Mertens, K., Muller, F., Lederer, M., Hoffmann, R., Mart, C., Kalkani, M. N., Steinke, P., Kampfe, T., MullerYear:
2020
DOI:
10.1109/IRPS45951.2020.9128337
File:
PDF, 1.05 MB
2020