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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling
Zanoni, Enrico, Meneghini, Matteo, Meneghesso, Gaudenzio, Rampazzo, Fabiana, Marcon, Daniele, Zhan, Veronica Gao, Chiocchetta, Francesca, Graff, Andreas, Altmann, Frank, Simon-Najasek, Michel, PoppitzYear:
2020
DOI:
10.1109/IRPS45951.2020.9128358
File:
PDF, 1.54 MB
2020