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[IEEE 2020 IEEE Workshop on Validation, Analysis and Evolution of Software Tests (VST) - London, ON, Canada (2020.2.18-2020.2.18)] 2020 IEEE Workshop on Validation, Analysis and Evolution of Software Tests (VST) - Simulating the Effect of Test Flakiness on Fault Localization Effectiveness
Vancsics, Bela, Gergely, Tamas, Beszedes, ArpadYear:
2020
DOI:
10.1109/VST50071.2020.9051636
File:
PDF, 973 KB
2020