[IEEE 2020 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) - Cluj-Napoca, Romania (2020.5.21-2020.5.23)] 2020 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) - Low Cost Defect Detection Using a Deep Convolutional Neural Network
Andrei-Alexandru, Tulbure, Henrietta, Dulf EvaYear:
2020
DOI:
10.1109/AQTR49680.2020.9130004
File:
PDF, 427 KB
2020