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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Specific aspects regarding evaluation of power cycling tests with SiC devices
Gerlach, Martina, Seidel, Peter, Lutz, JosefYear:
2020
DOI:
10.1109/IRPS45951.2020.9129128
File:
PDF, 921 KB
2020