[IEEE 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Grenoble, France (2020.3.9-2020.3.13)] 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Ternary Compute-Enabled Memory using Ferroelectric Transistors for Accelerating Deep Neural Networks
Thirumala, Sandeep Krishna, Jain, Shubham, Gupta, Sumeet Kumar, Raghunathan, AnandYear:
2020
DOI:
10.23919/DATE48585.2020.9116495
File:
PDF, 2.61 MB
2020