Reciprocal Space Map Measurement of Ceramics Thin Films for...

Materials Science Forum 2020 / 4 Vol. 985

Reciprocal Space Map Measurement of Ceramics Thin Films for Unequal Lattice Change at High Temperature

Saiki, Atsushi, Miwa, Shogo, Hashizume, Takashi
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Volume:
985
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.985.218
Date:
April, 2020
File:
PDF, 1.61 MB
2020
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