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Revealing electromigration on dielectrics and metals through the step-bunching instability
Usov, Victor, Coileáin, Cormac Ã, Chaika, Alexander N., Bozhko, Sergey I., Semenov, Valery N., Krasnikov, Sergey, Toktarbaiuly, Olzat, Stoyanov, Stoyan, Shvets, Igor V.Volume:
102
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.102.035407
Date:
July, 2020
File:
PDF, 2.81 MB
2020