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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories
Wang, Nian-Jia, Lee, Kuan-Yi, Lin, Hsin-Yi, Hsiao, Wei-Hao, Lee, Ming-Yi, Kuo, Li-Kuang, Lin, Ding-Jhang, Chao, Yen-Hai, Lu, Chih-YuanYear:
2020
DOI:
10.1109/IRPS45951.2020.9128993
File:
PDF, 354 KB
2020