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[IEEE 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - New Orleans, LA, USA (2020.3.15-2020.3.19)] 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) - Fault Detection Technique Based On Clustering Approach of Artificial Intelligence in Electric Vehicle Converters
Sharma, A., ElHaj, Y., Youssef, Mohamed Z., Ren, Jing, Orabi, MohamedYear:
2020
DOI:
10.1109/APEC39645.2020.9124266
File:
PDF, 2.23 MB
2020