Clocked and event-driven redundant adjustable precision...

Microelectronics Reliability 2020 / 08 Vol. 111

Clocked and event-driven redundant adjustable precision computing

Skaf, Ali, Ezzadeen, Mona, Benabdenbi, Mounir, Fesquet, Laurent
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Volume:
111
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113729
Date:
August, 2020
File:
PDF, 1.86 MB
2020
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