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Damage-free Structural and Optical Characterization for InGaN/GaN Multi-Quantum Well Epi-Layers
Yoon, Young Joon, Kim, Mi-Yang, Kwak, Joon SeopVolume:
25
Year:
2013
Journal:
Asian Journal of Chemistry
DOI:
10.14233/ajchem.2013.OH35
File:
PDF, 527 KB
2013