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AMPLITUDE-ONLY MEASUREMENTS OF A DUAL OPEN ENDED COAXIAL SENSOR SYSTEM FOR DETERMINATION OF COMPLEX PERMITTIVITY OF MATERIALS
Lee, Kim Yee, Chung, Boon-Kuan, Abbas, Zulkifly, You, Kok Yeow, Cheng, Ee MengVolume:
28
Year:
2013
Journal:
Progress In Electromagnetics Research M
DOI:
10.2528/pierm12082906
File:
PDF, 305 KB
2013