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Ag/HfO2-based conductive bridge memories elaborated by atomic layer deposition: impact of inert electrode and HfO2 crystallinity on resistive switching mechanisms
Saadi, M., Gonon, P., Vallée, C., Jomni, F., Jalaguier, E., Bsiesy, A.Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-020-03903-9
Date:
July, 2020
File:
PDF, 1.37 MB
2020