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[IEEE 2020 Device Research Conference (DRC) - Columbus, OH, USA (2020.6.21-2020.6.24)] 2020 Device Research Conference (DRC) - Modeling Multi-states in Ferroelectric Tunnel Junction
Luo, Yuan-Chun, Hur, Jae, Wang, Panni, Khan, Asif Islam, Yu, ShimengYear:
2020
DOI:
10.1109/DRC50226.2020.9135154
File:
PDF, 925 KB
2020