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[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro
Trang Dang, Le Dinh, Dinh Linh, Trinh, Dat, Ngyuen Thanh, Min, Changhong, Kim, Jinsang, Chang, Ik-Joon, Han, Jin-wooYear:
2020
DOI:
10.1109/IRPS45951.2020.9128910
File:
PDF, 719 KB
2020