Microstructure of Stacking Fault Complex/Carrot Defects at...

  • Main
  • 2020 / 5
  • Microstructure of Stacking Fault Complex/Carrot Defects at...

Microstructure of Stacking Fault Complex/Carrot Defects at Interface Between 4H-SiC Epitaxial Layers and Substrates

Sako, Hideki, Kobayashi, Kenji, Ohira, Kentaro, Isshiki, Toshiyuki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-020-08187-7
Date:
May, 2020
File:
PDF, 2.10 MB
2020
Conversion to is in progress
Conversion to is failed