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Comparative study of aluminum and nickel contact electrodes for indiumâtinâzinc oxide thin film transistors using oxygen vacancy diffusion model
Park, Joonghyun, Shin, Myunghun, Yi, JunsinVolume:
120
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2020.105253
Date:
December, 2020
File:
PDF, 3.77 MB
2020