Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques
W. Ludwig, A. King, M. Herbig, P. Reischig, J. Marrow, L. Babout, E. M. Lauridsen, H. Proudhon, J. Y. BuffièreVolume:
62
Language:
english
Pages:
7
DOI:
10.1007/s11837-010-0176-6
Date:
December, 2010
File:
PDF, 1.35 MB
english, 2010