Materials applications of photoelectron emission microscopy
G. Xiong, R. Shao, S. J. Peppernick, A. G. Joly, K. M. Beck, W. P. Hess, M. Cai, J. Duchene, J. Y. Wang, W. D. WeiVolume:
62
Language:
english
Pages:
4
DOI:
10.1007/s11837-010-0189-1
Date:
December, 2010
File:
PDF, 743 KB
english, 2010