Reliability Analysis for Electronic Devices Using...

IEEE Access 2020 Vol. 8

Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution

Ali, Sajid, Ali, Shafaqat, Shah, Ismail, Siddiqui, Ghazanfar Farooq, Saba, Tanzila, Rehman, Amjad
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Volume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/ACCESS.2020.3000951
File:
PDF, 1.43 MB
2020
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