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[IEEE 2019 IEEE AFRICON - Accra, Ghana (2019.9.25-2019.9.27)] 2019 IEEE AFRICON - Performance Analysis Of Ultra Low-Voltage Rail-to-Rail Comparator In 130 nm CMOS Technology
Nagy, Lukas, Arbet, Daniel, Kovac, Martin, Potocny, Miroslav, Sovcik, Michal, Stopjakova, VieraYear:
2019
DOI:
10.1109/AFRICON46755.2019.9133843
File:
PDF, 1.25 MB
2019